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	<title> &#187; deuterium-halogen</title>
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		<title>Extended-range Measurement of a Deuterium-Halogen Light Source</title>
		<link>http://www.spectroscopytips.com/apps/extended-range-measurement-of-a-deuterium-halogen-light-source/</link>
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		<pubDate>Mon, 15 Mar 2010 11:56:22 +0000</pubDate>
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				<category><![CDATA[light measurement]]></category>
		<category><![CDATA[deuterium-halogen]]></category>
		<category><![CDATA[light source]]></category>

		<guid isPermaLink="false">http://www.spectroscopytips.com/apps/?p=148</guid>
		<description><![CDATA[Broad UV-NIR spectral coverage can be achieved in a miniature spectrometer configured with our XR-1 Extended Range grating, which is responsive from 200-1050 nm. Our USB2000+ Spectrometer with an XR-1 grating maintains good optical resolution over the UV-NIR range, making it useful for applications such as measuring the relative output of a combination deuterium-halogen light [...]]]></description>
			<content:encoded><![CDATA[<p>Broad UV-NIR spectral coverage can be achieved in a miniature spectrometer configured with our XR-1 Extended Range grating, which is responsive from 200-1050 nm. Our USB2000+ Spectrometer with an XR-1 grating maintains good optical resolution over the UV-NIR range, making it useful for applications such as measuring the relative output of a combination deuterium-halogen light source.<strong><span id="more-148"></span><br />
Introduction</strong></p>
<p>The ability to provide UV-NIR coverage in a single miniature spectrometer has always been a challenge. Trade-offs inherent to most diffraction gratings – most noticeably, the effect of blaze angle on the efficiency of the diffraction – can pose challenges for certain applications. While gratings were available that diffracted over a wide range, this came at the expense of decreased optical resolution and increased problems associated with second- and third-order overlap.</p>
<p>Newer gratings such as the XR-1 provide good efficiency over a wider wavelength range (200-1050 nm) than is otherwise possible with standard gratings. What’s more, good optical resolution (&lt;2.0 nm FWHM for most setups) can be maintained, and second- and third-order effects are eliminated by applying proprietary filtering technology to the CCD-array detector window. Transmission efficiency is affected only marginally by this filtering.</p>
<p>Broad spectral response in a single spectrometer offers convenience for those who regularly make measurements in both the UV-Vis and Vis-NIR, yet it also offers a solution for applications where samples are responsive across that same broad range. Examples include certain plasmas, solar irradiance, atomic emission lines and broad-range light sources.</p>
<p><strong>Experimental Conditions</strong></p>
<p>To test the response of the XR-1 grating, we installed the 500 lines/mm groove density grating in the optical bench of our USB2000+ Spectrometer. The spectrometer’s optical bench also included a 25 µm slit and order-sorting detector filter. The grating provides 850 nm of spectral range and is blazed at 250 nm.</p>
<p>The test sample for the experiment was our DH-2000-BAL Deuterium Tungsten Halogen Light Source. The DH-2000-BAL combines the continuous spectrum of deuterium and tungsten halogen light sources in a single optical path to produce a powerful, stable output from 215-2000 nm (we observed only the region from 200-1050 nm). A UV-Vis optical fiber collected the signal from the light source. We recommend our QP450-2-XSR optical fiber, which is a 455 µm core diameter fiber with excellent solarization resistance properties. Integration time of 10 milliseconds is typically sufficient for measuring a light source such as the DH-2000-BAL.</p>
<p><strong>Results</strong></p>
<p>The emission spectrum of the UV-NIR light source measured with the USB2000+XR matched the anticipated spectral output. The XR-1 grating showed good efficiency across the 200-1050 nm spectral range, with the best efficiency in the UV. Optical resolution was calculated at ~1.7 nm (FWHM) with a 25 µm slit (the standard slit option for the USB2000+XR) and at ~1.2 nm (FWHM) with a 5 µm slit. Other expected spectrometer performance characteristics were unaffected by the presence of the grating.</p>
<p><strong>Conclusions</strong></p>
<p>Results demonstrate that an Ocean Optics spectrometer configured with the XR-1 extended-range grating will provide spectral coverage across the 200-1050 nm spectral range without sacrificing optical resolution performance or being subject to second- and third-order diffraction effects. The XR-1 is available in the application-ready USB2000+XR, USB4000-XR1 and JAZ-EL200-XR1 Spectrometers (each has a 25 µm slit and order-sorting filter) or as a custom option in one of our other spectrometers. For applications requiring broad range and sub-nanometer optical resolution (FWHM), our HR2000+CG and HR4000CG-UV-NIR composite-grating spectrometers are recommended.</p>
<p><a href="http://www.spectroscopytips.com/apps/wp-content/uploads/xr_spectra.jpg"><img class="aligncenter size-medium wp-image-150" title="xr_spectra" src="http://www.spectroscopytips.com/apps/wp-content/uploads/xr_spectra-600x408.jpg" alt="" width="600" height="408" /></a></p>
<p><strong>More Online:</strong></p>
<p>- <a href="http://www.oceanoptics.com/Products/xrseries.asp">XR-Series Spectrometers</a></p>
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